The 48th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication Bizarre/Beautiful Micrograph Contest
“A good Micrograph is worth more than the MegaByte it consumes.”
Results Submitted by John Randall
The fields of research covered by this conference have been at the forefront of the drive to develop technology to make smaller and smaller structures. We have ventured into size regimes where we are often dependent on microscopes and the skill of microscopists to see the results of our work (and often what went wrong). To highlight the importance of micrographs to the field, the conference holds a micrograph contest. The entries were judged both from the technological and artistic standpoint. Six categories were defined:
Best Electron Micrograph
Best Ion Micrograph
Best Optical Micrograph
Best Scanning Probe Micrograph
Most Bizarre
Grand Prize
Honorable Mention
Honorable Mention 2The rules included the following:
• Entries had to be of a single image taken with a microscope and may not be significantly altered.
• There was no restriction with respect to the subject matter.
• Electron and ion micrographs had to be black and white.In 2004, 63 entries were submitted. There were many outstanding micrographs. The work represented in the submitted micrographs covered a wide range of fields including micro mechanical, photonic, and integrated circuit fabrication, chemical and dry etching, laser optics, carbon nanotube structures, carbon nanotube growth experiments, biological samples, material science experiments and, of course, e-beam, ion beam, x-ray, and photo lithography experiments.
The panel of judges who selected the award winners consisted of:
Prof. John Cleaver
Dr. Larry Thompson
Mrs. Nicki Marrian
